Test Generation for Synchronous Realizations of Boolean Interpreted Petri Nets Using Composite Multi-Valued Nets.

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Test Generation for Synchronous Realizations of Boolean Interpreted Petri Nets Using Composite Multi-Valued Nets.

In: Petri Net Newsletter No. 46, pages 15-28. April 1994.

Keywords: Test generation; synchronous sequential logic circuits; Boolean interpreted Petri nets; composite multi-valued nets; linear algebraic representation; single stuck faults.

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