In: Sov. J. Comput. Syst. Sci., Vol. 28, No. 1, pages 101-108. January-February 1990.
Abstract: An increase in the reliability of discrete devices can be achieved by operative diagnosis of failures and their timely renewal. In turn, the operational ability of diagnostics can be achieved by combining functional and testing methods of diagnosis. Implementation functional-testing diagnostics presupposes solution of a group of interrelated problems among which the basic one is the problem of determining testing effects from a set of working input sequences. The authors demonstrate the statement of this problem and its solution, in application to a specific discrete circuit, by employing the mathematical model developed.
Keywords: diagnostic simulation (in the) language (of) modified net; circuit reliability; failures diagnosis.