For the most recent entries see the
Petri Nets Newsletter.
A new approach in feature interaction testing.
Nakamura, Masahide;
Kikuno, Tohru
In:
Integration, the VLSI Journal, Volume 26, Issue 1-2, pages 211-223.
Elsevier Science Publishers B. V.,
December 1998.
Keywords:
FI testing; feature interaction; finite state machine; petri net;
telecommunication services.
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